Applied Materials Endura® PVD System
(Illustrative Example for Advanced Thin Film Deposition)
Technical Specifications:
- Process Technology
- Physical Vapor Deposition (PVD)
- Target Materials: Al, Cu, TiN, TaN, Co, and advanced alloys
- Film Thickness Range: 5 nm to 500 nm (±0.2 nm uniformity)
- Wafer Handling
- Substrate Size: 200mm/300mm wafers
- Throughput: Up to 120 wafers/hour
- Vacuum Level: ≤ 1×10⁻⁸ Torr base pressure
- Precision Control
- Temperature Range: -50°C to 600°C (multi-zone heating)
- RF Power: 2-10 kW with <1% stability
- Deposition Rate: 1-50 Å/sec (adjustable via closed-loop plasma monitoring)
- Advanced Features
- Magnetron Sputtering with IMP™ (Ionized Metal Plasma) technology
- Integrated metrology for in-situ thickness & stress measurement
- Reactive Gas System (Ar, N₂, O₂) with mass flow controllers
- Automation
- AMAT E3™ Equipment Engineering System
- SECS/GEM compatibility for Industry 4.0 integration
- Predictive maintenance via AI-based sensor analytics
Functional Applications:
- Logic Chips: Metal gate/interconnect layers
- Memory Devices: Barrier layers for 3D NAND and DRAM
- Advanced Packaging: TSV (Through-Silicon Via) metallization
- Emerging Technologies: MRAM and ferroelectric deposition
Key Advantages:
- Industry-leading <0.5% defect density
- 30% lower argon consumption vs. previous generations
- 99.5% uptime with quick-change target assemblies
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