GE PCIE-5565RC-200000 Product Introduction
1. Product Overview
The GE PCIE-5565RC-200000 is a high-speed industrial PCI Express (PCIe) data acquisition (DAQ) card engineered for real-time signal capture and processing. It serves aerospace, automotive testing, and industrial automation industries, focusing on applications like sensor data logging, dynamic system monitoring, and high-frequency signal analysis—critical for capturing transient or high-speed signals in precision testing scenarios.
Integrating multi-channel analog input and advanced signal conditioning, it delivers reliable data acquisition while complying with industrial EMI/EMC standards. Compatibility with standard DAQ software (e.g., LabVIEW, MATLAB) ensures seamless integration into existing test systems, making it a trusted choice for demanding data capture tasks.
2. Technical Parameters (Table)
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Category
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Specification
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Device Type
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Industrial PCIe x4 data acquisition card (analog input-focused)
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Analog Input Channels
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16 differential channels (32 single-ended optional)
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Input Range
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±1 V, ±2.5 V, ±5 V, ±10 V (software-selectable per channel)
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Sampling Rate
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2 MS/s per channel (simultaneous sampling); Maximum aggregate rate: 32 MS/s
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Resolution
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16 bits; Signal-to-Noise Ratio (SNR): ≥85 dB
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Memory Buffer
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2 GB on-board DDR4 (for continuous data buffering); Optional: External storage via PCIe
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Digital I/O
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8 digital input/output lines (TTL-compatible); 2 counter/timer channels (32-bit)
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Interface
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PCI Express x4 Gen 3; Data transfer rate: Up to 8 GB/s
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Environmental Ratings
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Operating temperature: 0°C to +55°C (32°F to +131°F); Storage temperature: -20°C to +70°C (-4°F to +158°F); Humidity: 5%–90% (non-condensing); EMI/EMC: EN 61326-1
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Certifications
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CE; UL 61010-1; CSA C22.2 No. 61010-1; RoHS compliant
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3. Product Specifications & Features
3.1 Core Specifications
The GE PCIE-5565RC-200000 is optimized for high-channel, high-speed data acquisition, with 16 differential channels (32 single-ended optional) fitting multi-sensor test setups (e.g., automotive engine vibration monitoring with 12+ sensors). Its 2 MS/s per-channel sampling rate captures high-frequency signals (e.g., 1 MHz transient voltage spikes), while 16-bit resolution ensures signal detail preservation.
The 2 GB on-board DDR4 buffer enables continuous data capture without PC memory bottlenecks, critical for long-duration tests (e.g., 1-hour sensor logging). Software-selectable input ranges (±1 V to ±10 V) adapt to diverse sensor outputs (e.g., low-voltage strain gauges, high-voltage pressure transducers).
3.2 Key Features
- High-Speed Simultaneous Sampling: 2 MS/s per channel captures all channels in real time, avoiding signal skew in multi-sensor setups.
- Large On-Board Buffer: 2 GB DDR4 prevents data loss during high-rate acquisition, supporting uninterrupted testing.
- Flexible Input Ranges: Software-selectable ranges eliminate the need for external signal scalers, simplifying system design.
- Robust EMI Immunity: EN 61326-1 compliance ensures stable operation in noisy industrial/test environments (e.g., near high-power motors).
- Easy Software Integration: Works with standard DAQ tools (LabVIEW, MATLAB), reducing development time for test applications.
4. Other GE Data Acquisition Products
GE offers complementary DAQ cards for diverse testing needs:
- GE PCIE-5564RC-200000: 8-channel variant (2 MS/s per channel) for smaller test setups (e.g., laboratory sensor testing).
- GE PCIE-5566RC-200000: 32-channel model (1 MS/s per channel) for large-scale multi-sensor monitoring (e.g., aerospace structure testing).
- GE PCIE-5575RC-200000: Analog output + input card (16 in/8 out) for closed-loop test systems (e.g., dynamic load control).
- GE USB-5565RC-200000: USB 3.1 variant (16 channels, 1 MS/s) for portable testing (e.g., field equipment diagnostics).
- GE PCIE-5585RC-200000: High-resolution model (24 bits, 500 kS/s) for low-noise applications (e.g., precision sensor calibration).
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